Issue |
E3S Web Conf.
Volume 622, 2025
2nd International Conference on Environment, Green Technology, and Digital Society (INTERCONNECTS 2024)
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Article Number | 01001 | |
Number of page(s) | 13 | |
Section | Engineering and Technology | |
DOI | https://doi.org/10.1051/e3sconf/202562201001 | |
Published online | 04 April 2025 |
Extraction of Solar Panel Image Texture Feature Using GLCM Method for Damage Analysis on Solar Panel Surface Images
1 Department of Informatics Engineering, Faculty of Engineering, University of Pancasila, Jakarta, Indonesia
2 Department of Computer Science, Asia e University, Selangor, Malaysia
3 Departement of Computer Science, National Defence University of Malaysia, Kuala Lumpur, Malaysia
* Corresponding author: ninuk.wiliani@univpancasila.ac.id
Existing techniques for assessing solar panel surface damage frequently lack precision in differentiating defect kinds, necessitating a dependable automated solution. Defects like cracks and scratches substantially diminish panel efficiency, underscoring the necessity of robust analytical procedures. This study seeks to validate the Gray Level Cooccurrence Matrix (GLCM) technique for extracting texture information to identify and analyze damage on solar panel surfaces. This method utilizes Python software and a dataset of solar panel surface photos to accurately distinguish between damaged and undamaged surfaces. The spot category demonstrates the lowest homogeneity (5636.922) and contrast (5632.922), signifying a smoother yet less uniform texture. Energy values are predominantly low across all categories, with marginally higher consistency in fractures (0.005) relative to others (0.002). The results indicate that faults enhance unpredictability and randomization in texture relative to the homogeneity of intact surfaces. These insights facilitate precise damage identification and enhanced maintenance plans. This research provides advancements in renewable energy, materials science, and computer vision, applicable to solar panel maintenance, quality assurance, and automated flaw identification within the photovoltaic sector.
© The Authors, published by EDP Sciences, 2025
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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