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Cited article:

Few-Shot Ultrasonic Defect Classification in Insulation Materials Using Finite Element Simulation and Siamese Neural Networks

Shaoheng Song, Xiaojian Liu, Hang Li, Zhifeng Li, Weihua Liu and Yaqin Song
NDT & E International 103424 (2025)
https://doi.org/10.1016/j.ndteint.2025.103424

Study of electric field stress on the surface contour and at the triple junction in three phase GIS with FGM spacer under the depression defect

Janaki Pakalapati, Venkata N. Kumar Gundavarapu, Deepak Chowdary Duvvada and Sravana Kumar Bali
International Journal of Emerging Electric Power Systems 21 (5) (2020)
https://doi.org/10.1515/ijeeps-2020-0080