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This article has been cited by the following article(s):
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Reassessing Self-Healing in Metallized Film Capacitors: A Focus on Safety and Damage Analysis
Lei Pan, Feipeng Wang, Yushuang He, Xinbo Sun, Guoqiang Du, Quantong Zhou, Jie Zhang, Zhicheng Zhang and Jian Li IEEE Transactions on Dielectrics and Electrical Insulation 31(4) 1666 (2024) https://doi.org/10.1109/TDEI.2024.3357441
Parametric and Catastrophic Failures of Metallized Film Capacitors Under High Voltage Stress