RETRACTED: Characterization of Microstructure and Mechanical Properties of Cast Materials using Advanced Techniques
E3S Web Conf., 430 (2023) 01111
Published online: 2023-10-06
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
SiMiC: Context-aware silicon microstructure characterization using attention-based convolutional neural networks for field-emission tip analysis
Jing Jie Tan, Rupert Schreiner, Matthias Hausladen, Ali Asgharzade, Simon Edler, Julian Bartsch, Michael Bachmann, Andreas Schels, Ban-Hoe Kwan, Danny Wee-Kiat Ng and Yan-Chai HumJournal of Vacuum Science & Technology B 43 (6) (2025)
https://doi.org/10.1116/6.0005068