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Cited article:

Failure Rate Measurement on Silicon Diodes Reverse Polarized at High Temperature

D. Osorno, E. Sanchis-Kilders, E. Maset, D. Gilabert, A. Ferreres, J. Jordán, V. Esteve, J.L. Gasent-Blesa

E3S Web Conf., 16 (2017) 11001

Published online: 2017-05-23

DOI: https://doi.org/10.1051/e3sconf/20171611001

This article has been cited by the following article(s):

Review of Health Prognostics and Condition Monitoring of Electronic Components

Cherry Bhargava, Pardeep Kumar Sharma, Mohan Senthilkumar, et al.
IEEE Access 8 75163 (2020)
https://doi.org/10.1109/ACCESS.2020.2989410