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Failure Rate Measurement on Silicon Diodes Reverse Polarized at High Temperature

D. Osorno, E. Sanchis-Kilders, E. Maset, D. Gilabert, A. Ferreres, J. Jordán, V. Esteve and J.L. Gasent-Blesa

E3S Web Conf., 16 (2017) 11001

DOI: https://doi.org/10.1051/e3sconf/20171611001

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