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Research and analysis on defect detection of semi-conductive layer of high voltage cable

Sanwei Liu, Jun Zhang, Yi Xie, Jianjia Duan, Fuyong Huang, Xiaoli Duan and Zeyu Zeng

E3S Web Conf., 185 (2020) 01057

DOI: https://doi.org/10.1051/e3sconf/202018501057

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