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Surface morphology and X-ray photoelectron spectroscopy of BiFeO₃ thin films deposited on top of Ta₂O₅/Si layers

Shikhgasan Ramazanov, Ştefan Ţălu, Rashid Dallaev, Guseyn Ramazanov, Pavel Škarvada, Jindřich Oulehla, Dinara Sobola and Dmitry Nazarov

E3S Web Conf., 295 (2021) 04009

DOI: https://doi.org/10.1051/e3sconf/202129504009

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