Formation of Impurity Accumulations in Silicon Doped with Nickel and CopperS.Z. Zainabidinov, Sh.K. Akbarov, N.A. Turgunov, N.B. Khaytimmetov and R.M. TurmanovaE3S Web Conf., 632 (2025) 03004DOI: https://doi.org/10.1051/e3sconf/202563203004