Gaas Displacement Damage Dosimeter Based on Diode Dark CurrentsJeffrey H. Warner, Scott R. Messenger, Cory D. Cress, Nicolas J-H Roche, Michael Yakes, Kenneth Clarke, Mitchell F. Bennett, Phillip P. Jenkins and Robert J. WaltersE3S Web Conf., 16 (2017) 02004DOI: https://doi.org/10.1051/e3sconf/20171602004
