Research on Properties of X-Ray Detection Film Based on Thallium Doped Cesium Iodide

¹ School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China
² School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China
³ School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China

^a email:1261642098@qq.com
^b email: 283419090@qq.com
^* corresponding author:
^c email: shuangliu@uestc.edu.cn

Abstract

As X-ray detection imaging has a wide range of applications in medicine, industry, public safety, etc., it is of great significance to study its imaging mechanism and improve its imaging performance. Based on the process of X-ray luminescence in the scintillator material, this paper established a simulation model using a microcrystalline column structure to investigate the relationship between the thickness of the detection film and the light conversion efficiency. With the help of the simulation tool MATLAB, the Monte Carlo method was used to simulate the light conversion process of X-ray in the film, and the results were obtained as follows. Under the condition of other parameters unchanged, the luminous efficiency reached the peak value with the increase of the film thickness, and then gradually decreased with the increase of film thickness. The reason why the conversion efficiency in the early stage increases with the increase of the film thickness is that the film is in a saturated state, and increasing the thickness can cause more X-ray particles to be converted. As the film thickness increases, more fluorescent photons are absorbed as they propagate in the film, resulting in a gradual decrease in conversion efficiency. Therefore, an appropriate film thickness can be selected based on the simulation results to obtain the ideal light conversion efficiency.