E3S Web Conf.
Volume 12, 2016i-DUST 2016 – Inter-Disciplinary Underground Science & Technology
|Number of page(s)||6|
|Section||Particles Detection and Measurement|
|Published online||05 December 2016|
Detection of alpha particle contamination on ultra low activity-grade integrated circuits
1 Centro de Ciências e Tecnologias Nucleares, Instituto Superior Técnico, Universidade de Lisboa, 2695-066 Bobadela, Portugal
2 Instituto de Telecomunicações, Instituto Superior Técnico, Universidade de Lisboa, 1049-001 Lisboa, Portugal
3 Laboratoire Souterrain à Bas Bruit, University of Nice, University of Avignon, Centre National de la Reserche Scientifique, Aix-Marseille University, Observatoire de la Côte d'Azur, 84400 Rustrel, France
4 Departamento de Física, Faculdade de Ciências, Universidade de Lisboa, 1749-016 Lisboa, Portugal
5 Xilinx Inc., San Jose, CA 95124, USA
a Corresponding author: firstname.lastname@example.org
We propose to apply the superheated droplet detector (SDD) technology to the measurement of alpha-particle emissivity on integrated circuits of ultra-low activity grade (< 1α/khcm2) for high reliability applications. This work is based on the SDDs employed within our team to the direct search for dark matter. We describe the modifications in the dark matter SDDs with respect to fabrication, signal analysis and characterization, in order to obtain a device with the adequate detection sensitivity and background noise.
© The Authors, published by EDP Sciences 2016
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0 (http://creativecommons.org/licenses/by/4.0/).
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