| Issue |
E3S Web of Conf.
Volume 384, 2023
Rudenko International Conference “Methodological Problems in Reliability Study of Large Energy Systems” (RSES 2022)
|
|
|---|---|---|
| Article Number | 01052 | |
| Number of page(s) | 5 | |
| DOI | https://doi.org/10.1051/e3sconf/202338401052 | |
| Published online | 26 April 2023 | |
Application of numerical and graphical methods of analysis in nonlinear resistive circuits of electronic devices
Tashkent State Technical University named after Islam Karimov, 100095, Uzbekistan, Tashkent, University St. 2A
* Corresponding author: abduraimoverkin69@gmail.com
The article discusses the research issues and methods of analysis of semiconductor circuits used in electronic circuits of contactless switching devices, provides analytical, graphic and numerical methods for the analysis of nonlinear semiconductor resistive circuits. The approximations of the Volt-Ampere characteristics (VACh) of semiconductor elements and the solution of the differential equations of state of electrical circuits by a numerical method using a computer are given. Diode, thyristor semiconductor nonlinear resistive circuits with active and inductive loads are considered. In the analysis of steady-state modes and transient processes, numerical methods for solving differential equations of states by the Euler method were used.
© The Authors, published by EDP Sciences, 2023
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.