Open Access
E3S Web Conf.
Volume 12, 2016
i-DUST 2016 – Inter-Disciplinary Underground Science & Technology
Article Number 04003
Number of page(s) 6
Section Microelectronics Materials, Devices and Systems
Published online 05 December 2016
  1. P. Eyben, W. Vandervorst, D. Alvarez, M. Xu, and M. Fouchier, Scanning Probe Microscopy, Springer, New York, 31 (2007) [Google Scholar]
  2. R. Coq Germanicus, E. Picard, B. Domenges, K. Danilo and R. Rogel, Applied Surf. Sci. 253, 6006 (2007) [CrossRef] [Google Scholar]
  3. L. Leyssenne, S. Wane, S. Massenot, D. Bajon, R. Coq-Germanicus, P. Descamps and G. Audoit, ICEAA 1032 (2013) [Google Scholar]
  4. Ph. Leclère, P. Viville, M. Jeusette, J.P. Aimé and R. Lazzaroni, In Scanning Probe Microscopies: beyond imaging, 175 (Wiley-VCH, 2006) [CrossRef] [Google Scholar]
  5. Y. Gan, Surface Sci. Rep. 64, 99 (2009) [CrossRef] [Google Scholar]
  6. L. Vázquez, R.C. Salvarezza, P. Herrasti, P. Ocón, J.M. Vara and A.J. Arvia, Applied Surf. Sci. 70 (1993) [Google Scholar]
  7. R.R.L. De Oliveira, D.A.C. Albuquerque, F.L. Leite, F.M. Yamaji, and T.G.S. Cruz, Measurement of the nanoscale roughness by atomic force microscopy: basic principles and applications INTECH (2012) [Google Scholar]
  8. B.K. Kim, S.J. Lee, J.Y. Kim, K.Y. Ji, Y.J. Yoon, M.Y. Kim, S.H. Park, and J.S. Yoo, Journal of Electr. Mat., 37(4), 527 (2008) [CrossRef] [Google Scholar]
  9. J. Wojewoda-Budka, Z. Huber, L. Litynska-Dobrzynska, N. Sobczak and P. Zieba, Mat. Chem. and Phys. 139, 276 (2013) [CrossRef] [Google Scholar]
  10. N.C. De Souza, J.R Silva, M.A. Pereira-da-Silva, M. Raposo, R.M. Faria, J.A. Giacometti, Journal of Nanosci. and Nanotech, 4(5), 548 (2004) [CrossRef] [PubMed] [Google Scholar]
  11. A.P. Pentland, IEEE transactions on pattern analysis and machine intelligence, 6, 661 (1984) [CrossRef] [PubMed] [Google Scholar]
  12. F. Biscarini, P. Samori, A. Lauria, P. Ostoja, R. Zamboni, C. Taliani, P. Viville, R. Lazzaroni and J.L. Bredas, Thin Solid Films, 284, 439 (1996) [CrossRef] [Google Scholar]
  13. T. Vicsek, Fractal growth phenomena 2, Singapore: World scientific (1992) [CrossRef] [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.