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Cited article:

Statistical investigations of an ENIG Nickel film morphology by Atomic Force Microscopy

Rosine Coq Germanicus, Philippe Leclère, Eric Hug, Florent Lallemand, Philippe Descamps

E3S Web Conf., 12 (2016) 04003

Published online: 2016-12-05

DOI: https://doi.org/10.1051/e3sconf/20161204003

This article has been cited by the following article(s):

Dopant activity for highly in-situ doped polycrystalline silicon: hall, XRD, scanning capacitance microscopy (SCM) and scanning spreading resistance microscopy (SSRM)

Rosine Coq Germanicus, Florent Lallemand, Daniel Chateigner, et al.
Nano Express 2 (1) 010037 (2021)
https://doi.org/10.1088/2632-959X/abed3e