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Cited article:

Low Side Gan Fet Driver for Space Applications

O. E. Mansilla, J. Broline, H. Satterfied, L. G. Pearce, E. J. Thomson

E3S Web Conf., 16 (2017) 12006

Published online: 2017-05-23

DOI: https://doi.org/10.1051/e3sconf/20171612006

This article has been cited by the following article(s):

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Radiation Physics and Chemistry 213 111244 (2023)
https://doi.org/10.1016/j.radphyschem.2023.111244

Research of single-event burnout and hardened GaN MISFET with embedded PN junction

Xin-Xing Fei, Ying Wang, Xin Luo, Meng-Tian Bao, Cheng-Hao Yu and Xing-Ji Li
Microelectronics Reliability 110 113699 (2020)
https://doi.org/10.1016/j.microrel.2020.113699