E3S Web of Conferences

Automatic condition monitoring method to find defects in high-voltage insulators using infrared images

A. D. Zaripova, D. K. Zaripov and A. E. Usachev

E3S Web Conf., 124 (2019) 03003

Published online: 25 October 2019

DOI: 10.1051/e3sconf/201912403003

A. D. Zaripova

D. K. Zaripov

A. E. Usachev

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