Open Access
E3S Web Conf.
Volume 12, 2016
i-DUST 2016 – Inter-Disciplinary Underground Science & Technology
Article Number 04001
Number of page(s) 9
Section Microelectronics Materials, Devices and Systems
Published online 05 December 2016
  1. Microphones, M., Technologies for High Performance Portable Healthcare Devices [Google Scholar]
  2. Verdot, T., et al., Modélisation d'une architecture innovante de microphone MEMS à détection par nano jauges. 21ème Congrès Français de Mécanique, 26 au 30 août 2013, Bordeaux, France (FR), 2013 [Google Scholar]
  3. Czarny, J., et al. New architecture of MEMS microphone for enhanced performances. in Semiconductor Conference Dresden-Grenoble (ISCDG), 2013 International, 2013, IEEE [Google Scholar]
  4. Marton, L. and C. Marton, ADVANCES ELECTRONC & ELECTRON PHYSICS, 1980, Elsevier Science [Google Scholar]
  5. Ghallab, Y.H. and W. Badawy, A new topology for a current-mode wheatstone bridge. Circuits and Systems II: Express Briefs, IEEE Transactions on, 2006, 53(1): p. 18–22 [CrossRef] [Google Scholar]
  6. O'Grady, A., Transducer/sensor excitation and measurement techniques. Analog Dialogue, 2000, 34(5): p. 1–6 [Google Scholar]
  7. Peyton, A. and V. Walsh, Analog Electronics with Op-amps: A Source Book of Practical Circuits, 1993, Cambridge University Press [Google Scholar]
  8. Azhari, S.J. and H. Kaabi, AZKA cell, the current-mode alternative of Wheatstone bridge. Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on, 2000, 47(9): p. 1277–1284 [Google Scholar]
  9. Toumazou, C. and F. Lidgey, Novel current-mode instrumentation amplifier. Electronics Letters, 1989, 25(3): p. 228–230 [Google Scholar]
  10. Barthelemy, H., et al. CMOS instrumentation-amplifier based on ASKA cell. in NEWCAS Conference (NEWCAS), 2010 8th IEEE International, 2010 [Google Scholar]
  11. Jaquay, J.W., Designers Guide to: Instrumentation amplifiers. Experimental Techniques, 1977, 2(2): p. 40–43 [Google Scholar]
  12. Enz, C.C. and G.C. Temes, Circuit techniques for reducing the effects of op-amp imperfections: autozeroing, correlated double sampling, and chopper stabilization. Proceedings of the IEEE, 1996, 84(11): p. 1584–1614 [Google Scholar]
  13. Jimmin, C., A.A. Abidi, and C.R. Viswanathan, Flicker noise in CMOS transistors from subthreshold to strong inversion at various temperatures. Electron Devices, IEEE Transactions on, 1994, 41(11): p. 1965–1971 [Google Scholar]

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