Testing digital instruments and power systems devices

Pavel Pavlov; Vladimir Fandeev; Valery Butakov; Dilyara Baymeeva; Venera Safiullina

doi:10.1051/e3sconf/202021601063

All issues

Volume 216 (2020)

E3S Web of Conf., 216 (2020) 01063

References

Open Access

Issue		E3S Web of Conf. Volume 216, 2020 Rudenko International Conference “Methodological problems in reliability study of large energy systems” (RSES 2020)


Article Number		01063
Number of page(s)		4
DOI		https://doi.org/10.1051/e3sconf/202021601063
Published online		14 December 2020

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P.P. Pavlov, R.G. Idiyatullin, R.S. Litvinenko, On the issue of assessing the reliability of the city’s information, 5, 23–26 (2017) [Google Scholar]
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N.F. Kashapov, L.S., Sabitov, R.S. Litvinenko, A.E. Auhadeev, P.P. Pavlov, Consideration of the influence of the reliability of elements of the urban electric transport system on its bandwidth, IOP Conference Series: Materials Science and Engineering, 1, (2019) [Google Scholar]
E.M. Khusnutdinova, G.R. Khamidullina, P.P. Pavlov, A.E. Aukhadeyev, R.S. Litvinenko, and A.N. Khusnutdinov, Training transport specialists based on a contemporary view of self-organization of sophisticated developing systems, IOP Conference Series: Materials Science and Engineering, 1, (2018) [Google Scholar]

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[1] G.B. Willams, Troubleshooting on microprocessor based system. Oxford: Pergamon Rress Ltd., (1984) [Google Scholar]

[2] GOST R 53480 Industrial product dependability. Terms and definitions, Moscow: Standartinform, (2009) [Google Scholar]

[3] Zh. A. Romanovich, V.A. Scriabin, V. P. Fandeev, B. V. Tsypin, Testing, repair and maintenance of control systems for household machines and appliances: textbook. Moscow: Dashkov and Co., a publishing and trading corporation, (2016) [Google Scholar]

[4] P.P. Pavlov, R.G. Idiyatullin, R.S. Litvinenko, On the issue of assessing the reliability of the city’s information, 5, 23–26 (2017) [Google Scholar]

[5] V.N. Yarmolik, Analysis of signature testability of digital circuits//Automatics and telemechanics, 10, pp. 156–167, (1989) [Google Scholar]

[6] V.P. Fandeyev, Technology and failure analysis tools for recovered electronic devices: monograph. Penza: Penza State University Press, 240, (2001) [Google Scholar]

[7] G. Gordon, H. Nadig, Localization of malfunctions in microprocessor-based systems using hexadecimal key codes//Electronics, 5, 23-33, (1977) [Google Scholar]

[8] V.P. Fandeev, Vyach.P. Fandeev, P.P. Pavlov, Methodological reliability of signature analysis and improving its performance//New information technologies in complex systems: abstract, 88, (1995) [Google Scholar]

[9] A.E. Auhadeev, R.G. Idiyatullin, L.N. Kisneeva, P.P. Pavlov, R.S. Litvinenko, Identification of electric traction in the urban electric transport system, IOP Conference Series: Materials Science and Engineering, 1,(2019) [Google Scholar]

[10] N.F. Kashapov, L.S., Sabitov, R.S. Litvinenko, A.E. Auhadeev, P.P. Pavlov, Consideration of the influence of the reliability of elements of the urban electric transport system on its bandwidth, IOP Conference Series: Materials Science and Engineering, 1, (2019) [Google Scholar]

[11] E.M. Khusnutdinova, G.R. Khamidullina, P.P. Pavlov, A.E. Aukhadeyev, R.S. Litvinenko, and A.N. Khusnutdinov, Training transport specialists based on a contemporary view of self-organization of sophisticated developing systems, IOP Conference Series: Materials Science and Engineering, 1, (2018) [Google Scholar]