Open Access
| Issue |
E3S Web Conf.
Volume 252, 2021
2021 International Conference on Power Grid System and Green Energy (PGSGE 2021)
|
|
|---|---|---|
| Article Number | 02020 | |
| Number of page(s) | 4 | |
| Section | Research and Development of Electrical Equipment and Energy Nuclear Power Devices | |
| DOI | https://doi.org/10.1051/e3sconf/202125202020 | |
| Published online | 23 April 2021 | |
- Binnig G, Rohrer H. Scanning tunneling microscope: US, US 4343993 A[P]. 1982. [Google Scholar]
- Binning G, Rohrer H, Gerber C, et al. Surface Studies by Scanning Tunneling Microscopy[M]// Scanning Tunneling Microscopy. Springer Netherlands, 1982:1090–1092. [Google Scholar]
- Binnig G, Rohrer H, Gerber C, et al. Surface Studies by Scanning Tunnelling Microscopy, Phys. Rev. Lett. 49, 57–61[J]. Physical Review Letters, 1982, 49:57–61. [CrossRef] [Google Scholar]
- Hamers R J, Tromp R M, Demuth J E. Scanning tunneling microscopy of Si(001)[J]. Physical Review B, 1986, 34(8): 5343–5357. [Google Scholar]
- Tekman E, Ciraci S. Atomic theory of scanning tunneling microscopy.[J]. Physical Review B Condensed Matter, 1989, 40(40): 10286–10293. [Google Scholar]
- Mingo N, Jurczyszyn L, Garcia-Vidal F J, et al. Theory of the scanning tunneling microscope: Xe on Ni and Al[J]. Physical Review B Condensed Matter, 1996, 54(3): 2225–2235. [Google Scholar]
- Braun K F, Hla S W. Force measurement with a scanning tunneling microscope[J]. Physical Review B Condensed Matter, 2007, 75(3): 3406. [Google Scholar]
- Tersoff J, Hamann D R. Theory of the scanning tunneling microscope[J]. Physical Review B Condensed Matter, 1985, 31(2): 805–813. [Google Scholar]
- Nishikawa O, Tomitori M, Iwawaki F, et al. Image Quality of Stm and Apex Profile of A Scanning Tip[J]. Le Journal De Physique Colloques, 1989, 50(C8): C8–217-C8–222. [Google Scholar]
- Xie Z X, Kolb D M. Spatially confined copper dissolution by an STM tip: a new type of electrochemical reaction?[J]. Journal of Electroanalytical Chemistry, 2000, 481(2): 177–182. [Google Scholar]
- Yu Z Q, Wang C M, Du Y, et al. Reproducible tip fabrication and cleaning for UHV STM[J]. Ultramicroscopy, 2008, 108(9): 873–877. [PubMed] [Google Scholar]
- Méndez J, Luna M, Baró A M. Preparation of STM W tips and characterization by FEM, TEM and SEM[J]. Surface Science, 1992, 266(1–3): 294–298. [Google Scholar]
- Gu K, Tang J, Zhang X, et al. Preparation of STM Tips Using Lamella Drop-off Technique[J]. Guangdong Chemical Industry, 2007. [Google Scholar]
- Niu J L, Xue W U, Feng L I, et al. Preparing tungsten tip of STM[J]. Physics Experimentation, 2010. [Google Scholar]
- Nagahara L A, Thundat T, Lindsay S M. Preparation and characterization of STM tips for electrochemical studies[J]. Review of Scientific Instruments, 1989, 60(10): 3128–3130. [Google Scholar]
- S.G. Garcı&#x;a, Salinas D R, Mayer C E, et al. STM tip-induced local electrochemical dissolution of silver[J]. Electrochimica Acta, 2003, 48(9): 1279–1285. [Google Scholar]
- Bach C E, Nichols R J, Meyer H, et al. An electropainting method for coating STM tips for electrochemical measurements[J]. Surface & Coatings Technology, 1994, 67(67): 139–144. [Google Scholar]
- Mao B W, Ye J H, Zhuo X D, et al. Anew method of STM tip fabrication for in-situ electrochemical studies[J]. Ultramicroscopy, 1992, s 42–44(3):464–467. [Google Scholar]
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