Prospects for detecting alternariose in potato plantings using hyperspectral measurements

Agrophysical Research Institute, St.Petersburg, 195220, Russia

^* Corresponding author: ashpanev@mail.ru

Abstract

The harmfulness of Alternaria leaf blight on potatoes has increased significantly in recent years in the North-West of Russia. For effective protection of potato plantings from the disease it is extremely important to detect it promptly. For that purpose the ground-based portable spectroradiometer PSR-1100 with a measurement range from 320 to 1100 nm was used. The study was conducted at the experimental station of Menkovo branch of Agrophysical research institute located in Gatchina district of Leningrad region. The result of the study revealed that even in case with a slight damage of potato plants with Alternaria leaf blight (less than 10% of the leaf surface) there were significant changes in the values of the reflectivity of potato leaves were recorded by the device in the near infrared part of the spectrum especially with severe damage to the leaf surface (25-50% of the leaf surface). At the same time there were no significant differences in the entire measured wavelength range (320-1100 nm) in plants with Alternaria leaf blight damage to 25% of the leaf surface. Thus, the detection of Alternaria leaf blight in potato plantings is practicable by means of ground-based hyperspectral measurements.